Piero Olivo received the Laurea degree (cum laude) (1980) and the Ph.D. (1987) in electronic engineering from the University of Bologna, Italy. Since 1980 he was with the University of Bologna. In 1986 he was with IBM T.J. Watson Research Center. Since 1994 he is full professor of electronics at the University of Ferrara, Italy. His scientific interests are in the area of solid state devices and ICs design and test. In the field of solid state devices he has worked on SiO2 physics, thin oxide properties, oxide breakdown and reliability, nonvolatile memories characterization. In the field of ICs design & test he has worked on Signature Analysis testing, Design For Testability techniques, fault modeling and fault simulation, nonvolatile memory testing.