Hoon Lim received the B.S. (1988) in material science and engineering from Korea University, and M.S (1991) and Ph.D. (1997) from KAIST. Since 1997, he has been working at Samsung Electronics, Korea. From 1998, he was involved in the static random access memory group for the technology development in the advanced memory. His area of interests has included the design and analysis of high performance MOSFET, the thin gate oxide reliability and process architecture and integration for the advanced SRAM.