Danelle M. Tanner received the Ph.D. (1983) in physics from Texas A&M University. She hired into SNL in '84 to perform radiation effects testing in electronic systems and subsystems. She transferred into the Reliability Physics Dept. in '92 and specialized in oxide reliability in microelectronics. Dr. Tanner's present research interest is MEMS reliability where the focus is on using statistical characterization to understand the physics of failure and develop predictive models.