Norman F. Smith received the B.S.E.E.T. (1989) from DeVry Institute of Technology. He joined Sandia National Labs in 1989, where he developed wafer level reliability software routines and automated test equipment for CMOS products. In 1996, he began working in the area of MEMS reliability. He has authored and co-authored several papers in the area of MEMS characterization and reliability. He is currently pursuing a Master's in manufacturing engineering.