Tom C. (Chuenhuei) Lee came to United States in 1986 to pursue the Ph.D. in materials science and engineering at Stanford University. In 1990, he started to work for IBM-Storage System Division at San Jose, CA, as process engineer. In 1994 he started working for Motorola, Phoenix, AZ, as reliability engineer. He had experiences in electromigration, gate dielectric, and hot carrier reliability. While working at Motorola, Tom went to Arizona State University to get the Masters in electrical engineering. He rejoined the IBM at Burlington, VT as reliability engineer at the end of 1999. His responsibility is BEOL related reliability issues.