Kiyoshi Nikawa received the B.S. (1972) and M.S. (1974) in material science, and Dr. Eng. (1995) from Osaka University, Osaka, Japan. He has been with NEC Corp., Japan, since 1974, where he has been working on reliability engineering for Si integrated circuits, especially, on bipolar devices, electromigration, failure analysis using focused ion beam, electron beam testing, laser beam. He is an author and a coauthor of many technical papers and several books. He is a member of Reliability Engineering Association of Japan (REAJ), the Japan Society of Applied Physics, IEEE, and Electron Device Failure Analysis Society (EDFAS). He received the best paper awards in Reliability & Maintainability Symposium 1996 and 2000 (Union of Japanese Scientists and Engineers).