Robin Degraeve received the M.Sc. (1992) in electrical engineering from the University of Gent, Belgium and Ph.D. (1998) from the Catholic University of Leuven, Belgium. He joined the Interuniversity Micro-Electronics Center (IMEC) in Leuven in the Technology Reliability and Yield group. His present interests and activities cover hot-carrier reliability issues in MOSFETs, and reliability physics of thin SiO2 and alternative high-k gate dielectrics.