Jurriaan Schmitz (1967) received the Master's (1990, cum laude) and Ph.D. (1994) in experimental physics from the University of Amsterdam, The Netherlands. He was an editor of the Dutch Physics Journal from 1991-1995. He joined Philips Research in 1994, and worked on CMOS frontend integration as a Research Scientist, and authored and co-authored over 20 conference contributions and regular papers in this field. He chaired the CMOS Devices subcommittee of the 1999 IEEE IEDM Conference. In 1999, his field of research shifted to gate oxide characterization and reliability.