Shang-Jr Chen received the B.S. (1996) in electo-physics and the M.S. (1998) in electrical engineering from the National Chaio Tung University, Taiwan. Right now, he is working towards the Ph.D. in the Dept. of Electronic Engineering at the National Chiao-Tung University, Taiwan. His current study is focused on hot carrier reliability characterization of submicron and deep-submicron MOSFET's.