| WORKSHOP | MODERATOR(S) |
|---|---|
| Cu/low-k EM - | Paul Ho (UT) |
| ESD - | Charvaka Duvvury (TI) & Tim Maloney (Intel) |
| Dielectrics - | Paul Nicollian (TI) & Eric Vogel (NIST) |
| Failure Analysis - | Larry Wagner (TI) |
| Product Reliability & Qual - | Jay Ondrusek (TI) |
| NBTI - | Prasad Chaprala (National) & G.Larosa (IBM) |
| FLASH & FRAM- | Tamer San (TI), Andrei Mihnea (Micron), Steve Traynor (Ramtron) |
| Fast WLR Monitoring for Fab Process - | Fred Kuper (Philips Semiconductors) & Eric Snyder (Sandia Technologies) |
| Packaging - | TBD |
| MEMS - | Mike Douglass (TI) |
| Charging - | Paul Aum (Spider Systems) |
Contact: Workshop Chair: Srikanth Krishnan, Texas Instruments
s-krishnan1@ti.com 972-840-8815