Reinventing CMOS: Physics, Reliability and The Roadmap

Ted Dellin
Chief Scientist, Microsystems Center
Sandia National Laboratories
Contributor, International Technology Roadmap for Semiconductors

To sustain historic rates of IC improvements in the face of physical and material challenges will require new materials and new devices. This tutorial will look at the major challenges, their potential solutions, and the International Technology Roadmap for Semiconductors from a reliability perspective.