Reinventing CMOS: Physics, Reliability and The Roadmap

To sustain historic rates of IC improvements in the face of physical and material challenges will require new materials and new devices. This tutorial will look at the major challenges, their potential solutions, and the 2003 International Technology Roadmap for Semiconductors from a reliability perspective.

Dr. Theodore (Ted) Dellin is the Chief Scientist of the Microsystems Center at Sandia National Laboratories in Albuquerque, New Mexico. He has 23 years experience in microelectronics and microsystems. Dr. Dellin has coordinated the reliability section of the commercial industry’s International Technology Roadmap for Semiconductors since 1997, is a member of the Sematech Reliability Technical Advisory Board and is a past Chair of the IEEE Nonvolatile Memory Technology Workshop. He has taught nationally televised courses for the University of New Mexico and short courses in the U.S. and Europe. Dr. Dellin founded the Electronics Quality/Reliability Center at Sandia and guided its technical development and broad base of industrial partnerships. He has a PhD in physics from the City University of New York.