SER:
From Fundamentals to
Testing and Design

Robert Baumann

Robert Baumann received the B.A. (1984) with honors in physics from Bowdoin College and the Ph.D. (1990) in electrical engineering from Rice University, researching ferroelectric process development and integration for opto-electronic applications. He joined Texas Instruments in 1989 where he made significant contributions to the understanding of alpha and neutron effects including the discovery that activation of 10B in BPSG by low energy neutrons is a significant source of soft errors in advanced technologies. Most of the semiconductor industry has since followed suit, eliminating BPSG from advanced technologies. He is currently a Distinguished Member of the Technical Staff, focused on radiation effects in advanced SRAM and logic devices. Robert was one of the primary authors of the International JEDEC JESD-89 specification that has become the defacto industry standard for radiation effects testing of commercial electronics. Robert is co-chairing an SIA experts panel on radiation effects regarding the International Traffic in Arms Regulations (ITAR) and its potential for inadvertently capturing commercial technologies. Robert was recently elected to Fellow of the IEEE for “For contributions to the understanding of the reliability impact of terrestrial radiation mechanisms in commercial electronics.”