Reinventing CMOS
(To Stay on Moore's Law)

Continued scaling of CMOS ICs is running into increasing difficult physical and material limitations. Going forward requires unprecedented changes including new materials and new device structures. The tutorial starts with a description of the power and parsitics problems encountered with scaling into the deep submicron regime. It next considers the new materials and devices proposed in the ITRS Roadmap to overcome those limitations. The focus is on near-term modifications to CMOS, not on the longer-term, novel, non-CMOS solutions. It concludes with a look at the impact of this unprecedented change on reliability and the reliability requirements given in the ITRS roadmap.

Ted Dellin

Dr. Ted Dellin is president of Quick Start Micro Training LLC, the leader of the reliability section of the ITRS Roadmap, a member of the Sematech Reliability Technical Advisory Board and the Chief Scientist Emeritus of the Microsystems Center at Sandia National Laboratories. Dr. Dellin founded and runs the in-house Microsystems University at Sandia, has taught short courses in devices, technology and reliability for companies in the U.S. and Europe, and has presented three past tutorials at IRPS. A complete bio for Dr. Dellin can be found at http://www.quickstartmicro.com/about_us.htm.