Reinventing CMOS
(To Stay on Moore's Law)

Continued scaling of CMOS ICs is running into increasing difficult physical and material limitations. Going forward requires unprecedented changes including new materials and new device structures. The tutorial starts with a description of the power and parasitics problems encountered with scaling into the deep submicron regime. It next considers the new materials and devices proposed in the ITRS Roadmap to overcome those limitations. The focus is on near-term modifications to CMOS, not on the longer-term, novel, non-CMOS solutions. It concludes with a look at the impact of this unprecedented change on reliability and the reliability requirements given in the ITRS roadmap. An extended abstract can be found at http://www.quickstartmicro.com/toppage1.htm

Ted Dellin

Dr. Ted Dellin leads the development of the reliability section of the International Technology Roadmap for Semiconductors. He has over 25 years experience in microelectronics and microsystems. Dr. Dellin is the Chief Scientist Emeritus of the Microsystems Center at Sandia National Laboratories and a member of the Sematech Reliability Technical Advisory Board. Dr. Dellin founded and runs the in-house Microsystems University at Sandia, teaches short courses in devices, technology and reliability for companies in the U.S. and Europe, and has presented four past tutorials at IRPS. A complete bio for Dr. Dellin can be found at http://www.quickstartmicro.com/about_us.htm