Roche, Philippe

Philippe Roche received the M.S. (1995) and Ph.D. (1999) in semiconductor physics from the University of Montpellier, France. In 1995, he worked on electronic noise at the University of Eindhoven, the Netherlands. From 1995 to 1996, he joined the French Atomic Energy Commission and contributed to researches on CMOS technologies for military applications. From 1996 to 1999, he worked on Single Event Effects in SRAMs at the University of Montpellier. In 1999, he held a summer staff position in the Radiation Effects Group at the Vanderbilt University, USA. Since 1999, he has been with the Central R&D of STMicroelectronics, Crolles, France, as project manager on radiation effects in semiconductor devices. His primary research activities are induced soft errors on sub-0.25µm commercial technologies. He has been serving in technical committees of conferences since 1997, such as recently session chairman at the 2004 International Nuclear Space Radiation Effects conference. Dr. Roche has coauthored more than 30 articles and has filed 17 patents in radiation hardening.