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IEEE IRPS 2006
RELIABILITY PHYSICS TUTORIALS & YEAR IN REVIEW SESSIONS
Sunday & Monday March 26-27
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(Tutorial registration choices: Sunday, Monday, or both & a set of Tutorial Notes for each day)
This year Monday tutorial registration includes Year In Review 2:45 - 5:45 p.m.
Chair: Srikanth Krishnan, Texas Instruments
972-995-9606; s-krishnan1@ti.com
Vice Chair: Walter Riordan, Intel
480-723-2470; walter.riordan@intel.com
Sunday, March 26, TUTORIALS · 8 a.m. — 5:00 p.m.,
San Jose McEnery Convention Center & Hilton San Jose
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Room A
| 101. | Reliability Fundamentals |
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R. Degraeve (IMEC)
abstract | |
8:00 – 11:30 |
| 102. | Wafer Level Reliability |
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A. Martin (Infineon)
abstract | |
1:30 – 3:00 |
| 110. |
Process Induced Damage |
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T. Hook (IBM)
abstract | |
(3:30 - 5:00) |
Room B
| 121. |
SER Fundamentals
N. Seifert (Intel)
abstract |
| (8:00 - 9:30) |
| 122. |
SER System
C. Slaymen (Sun Micro.)
abstract |
| (10:00 - 11:30) |
| 130. |
BEOL 45 nm & Beyond
J. Gambino (IBM)
abstract |
| (1:30 - 3:00) |
| 140. |
Package Reliability
Krishna Seshan (Intel)
abstract |
| (3:30 - 5:00) |
Room C
| 151. |
Analog & Digital Circuits
K. Roy (Purdue) abstract |
| (8:00 - 9:30) |
| 152. |
Mixed Signal Circuit Reliability
C. Schluender (Infineon) abstract |
| (10:00 - 11:30) |
| 160. |
ESD & Latchup |
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G. Boselli (TI)
abstract | |
(1:30 - 3:00) |
Room D
| 170. |
FeRAM Reliability |
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J. Rodriguez (TI)
abstract | |
(8:00 - 9:30) |
| 180. |
Hydrogen in Si |
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S. Ashok (PSU)
abstract | |
(10:00 - 11:30) |
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(1:30 - 3:00) |
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(3:30 - 5:00) |
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Monday, March 27, TUTORIALS & YEAR IN REVIEW · 8 a.m. — 5:45 p.m.,
San Jose McEnery Convention Center & Hilton San Jose
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Room A
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(8:00 - 9:30) |
| 202. |
GOI Impact on Circuits |
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B. Kaczer (IMEC)
abstract | |
(10 - 11:30) |
| 210. |
High-k Gate Dielectrics |
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M. Takayanagi (Toshiba)
abstract | |
(1:00 - 2:30) |
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| (2:45 - 5:45) |
Special Panel Session made up of
the Reviewers/Tour Guides of
Reliability Year-In-Review
Open to all tutorial and symposium attendees | (6:00 - 7:00) |
Room B
| 220. |
SRAM Vmin / Reliability |
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W. Ellis (IBM)
abstract | |
(8:00 - 9:30) |
| 230. |
IC Testing for Reliability |
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K. Butler (TI)
abstract | |
(10:00 - 11:30) |
Room C
| 241. |
Electromigration |
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Y. Park (TI)
abstract | |
(8:00 – 9:30) |
| 242. |
Mechnical Aspects
Interconnects |
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Z. Suo (Harvard)
abstract | |
(10:00 – 11:30) |
| 243. |
Cu microstructure impact
on reliability |
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J. Koike (Tohuku Univ.)
abstract | |
(1:00 - 2:30) |
Room D
| 250. |
HV CMOS Reliability |
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P. Moens (AMI)
abstract | |
(8:00 - 9:30) |
| 260. |
Reinventing CMOS |
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T. Dellin (Quick Start Micro Training)
abstract | |
(10:00 - 11:30
1:00 - 2:30) |
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