NVM Reliability

This tutorial reviews the basic operation of NOR and NAND floating-gate Flash memories and then describes their dominant reliability degradation mechanisms. Media-management methods in component and system design for dealing with these mechanisms are covered. Finally, product and technology qualification methods are discussed.

Neal Mielke

Neal Mielke received his B.S. in physics and M.S.E.E. from Stanford University in 1979 and joined Intel that year. He has focused on the development and reliability characterization of nonvolatile memory and logic technologies. He has 20 patents and 19 publications, mostly related to nonvolatile memories. He is currently Intel Fellow, Director of Reliability Methods. He serves on the Board of Directors for IRPS, the Advisory Committee for TDMR, and the IEEE EDS Device Reliability Physics Committee, and he has been active in defining JEDEC reliability standards.