Application specific reliability
and performance requirements
for high voltage and power devices
Sameer Pendharkar, TI
Today's mixed signal and high power technologies are driven by a continued requirement of a total system solution. This requires a high amount of integration with the resultant technology having a variety of components - both low voltage and high voltage. Cost and performance constraints typically require smart re-use and integration of CMOS specific process steps to build the high voltage (HV) and power components.
This talk focusses on the challenges in understanding the application driven reliability and performance requirements for HV devices. Device design and rating has to take into account application requirements such as voltage overshoot conditions, ESD requirements, switching frequency dependence. The issue of device reliability versus device size scaling will also be addressed in this talk.
In addition to reliable device design requirements, suitable test methodologies - both mixed signal and high voltage, are required for product characterization. Some such test methodologies, specific to high voltage devices, will also be discussed in this talk.
Sameer Pendharkar
Mr. Sameer Pendharkar did his undergratuate study at Indian Institute of Technology, Bombay, India and his graduate study at the University of Wisconsin, Madison. His graduate thesis work focussed on optimization of power devices for soft switching converter applications. Since 1996, he has been with Texas Instruments Inc. where he is presently a Distinguished Member of Technical Staff. His main focus at TI is designing and developing high voltage and high power devices and high voltage ESD components for numerous power BiCMOS and analog CMOS technologies. He has published more than 40 papers and has more than 40 issued and filed patents in the general area of semiconductor devices and is a Senior Member of IEEE