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Room A
| 101. | Introduction to Gate Oxide Reliability |
|
Jim Stathis, IBM
abstract | |
8:30 – 12:00 |
| 111. | NBTI in p-MOSFETs: Characterization, Modeling, & Material Dependence |
|
Souvik Mahapatra, IIT Bombay, Mumbai, India
abstract | |
2:00 – 3:30 |
| 112. | The NBTI challenge spreading from technology to design - Design for Reliability
|
|
Christian Schlünder, Infineon
abstract | |
4:00 – 5:30 |
Room B
| 120. |
SER Errors – History, Trends, & Challenges
Helmut Puchner, Cypress Semiconductor
abstract |
| (8:30 - 10:00) |
| 130. |
Latch-up
Steve Voldman, IBM
abstract |
| (10:30 - 12:00) |
| 140. |
On-chip ESD Protection
Elyse Rosenbaum, Univ. of Illinois at Urbana-Champaign
abstract |
| (2:00 - 5:30) |
Room C
| 150. |
Electromigration…From Black to Blech and beyond
Jim Lloyd, IBM
abstract |
| (8:30 - 12:00) |
| 160. |
Product Reliability – An Introduction
Robert Kwasnick, Intel
abstract |
| (2:00 - 3:30) |
| 170. |
Physics Based Reliability Qualification
Joey Bernstein, University of Maryland
abstract |
| (4:00 - 5:30) |
Room D
| 180. |
Introduction to Reliability |
|
Ted Dellin, Quick Start Micro Training
abstract | |
(2:00 - 5:30) |
Monday, April 16, TUTORIALS · 8 a.m. – 2:30 p.m.
and
YEAR IN REVIEW · 3 p.m. — 6:30 p.m.,
Phoenix Convention Center West Building
 |
|
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|
Room A
| 201. |
Mechanics of Interconnects |
| |
Zhigang Suo, Harvard University
abstract | |
(8:00 - 9:30) |
| 202. |
Copper Extendability |
| |
Glenn Alers, UC Santa Cruz | |
(10 - 11:30) |
| 210. |
Electrically Programmable Fuse – Programming, Reliability and Applications |
|
C. Kothandaraman & C.E. Tian, IBM
abstract | |
(1:00 - 2:30) |
Room B
| 221. |
CMOS Scaling & Gate Stack Technology Trends |
|
Raj Jammy, SEMATECH/IBM & Prashant Majhi, SEMATECH/Intel
abstract | |
(8:00 - 9:30) |
| 222. |
Reliability Implication in CMOS & Gate Stack Scaling |
|
Rino Choi & Gennadi Bersuker, SEMATECH
abstract | |
(10:00 - 11:30) |
| 230. |
Atomic Scale Defects Involved in Modern MOS Gate Stack Reliability Problems |
|
Pat Lenahan, The Pennsylvania State University
abstract | |
(1:00 - 2:30) |
Room C
| 241. |
NVM Reliability |
|
Neil Mielke, Intel
abstract | |
(8:00 – 9:30) |
| 242. |
Flash Process Technology Scaling Trends and their Impact to Reliability |
|
Kiran Pangal, Intel
abstract | |
(10:00 – 11:30) |
| 243. |
NVM – 2 (Embedded Memory)
|
|
Guoqiao Tao, NXP Semiconductors
abstract | |
(1:00 - 2:30) |
Room D
| 250. |
Application Specific Reliability and Performance Requirements for High Voltage and Power Devices |
|
Sameer Pendharkar, TI
abstract | |
(8:00 - 9:30) |
| 260. |
SRAM Scaling - Design and Reliability Challenges due to Stability Issues |
|
Stewart Rauch/ Mary Weybright, IBM | |
(10:00 - 11:30) |
| 270. |
Failure Analysis |
|
Jim Colvin, Consulting Services
abstract | |
(1:00 - 2:30) |
Year-In-Review · Room TBA
| 301. |
NBTI YEAR-IN-REVIEW |
|
Giuseppe LaRosa, IBM
abstract | |
(3:00 - 3:45) |
| 302. |
Assembly Package Interface YEAR-IN-REVIEW |
|
Rich Blish, Spansion and Bob Thomas, TEN
abstract | |
(3:45 - 4:30) |
| 303. |
Gate Dielectrics YEAR-IN-REVIEW |
|
Tanya Nigam, Cypress Semiconductor
abstract | |
(5:00 - 5:45) |
| 304. |
Non-Volatile Memory YEAR-IN-REVIEW |
|
Daniele Ielmini, Politecnico di Milano
abstract | |
(5:45 - 6:30) |
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