In advanced nodes, the variations at device level are becoming more and more important, either they are process-related (random fluctuations) or reliability-related (temporal variations).

Dealing with the increasing threat of intrinsic reliability, the workshop will address two main points:

1) Does the intrinsic reliability wear-out part of the bath-tube curve experimentally accessible or not?

2) Enabling reliable products: What are the challenges/solutions/costs of enabling reliable products?