About IRPS
The focus of the symposium is
the 3-day plenary/parallel sessions featuring original work that identifies new
microelectronic failure or degradation mechanisms, improves understanding of
known failure mechanisms, demonstrates new or innovative analytical techniques,
or demonstrates ways to build-in reliability. Specific areas to be addressed
during the 2008 IRPS are reliability concerns associated with silicon
(integrated circuits, discrete devices, MEMS), non-silicon (GaAs,
LEDs and diode lasers, optical fiber and flat panel
displays), and emerging technologies including organic electronics and
nanotechnology:
- Product Reliability and Burn-In
- Non-Volatile Memory
- Qualification Strategies
- Circuits and Systems
- Soft Error Effects
- Assembly and Packaging
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- Failure Analysis
- Transistors
- High Power Devices
- Devices and Processing
- Interconnects
- Device Dielectrics
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- ESD and Latch-Up
- Process Induced Damage
- MEMS
- Nanoelectronics Device Reliability
- Organic Electronics
|
Other opportunities at the
symposium include:
- A 2-day Tutorial Program featuring a set of bound notes from all
tutorials. Attendees have the opportunity to learn a new area in some
technical depth from an industry expert or brush up on the fundamentals
with introductory tutorials. There are typically about 20 tutorials that
are offered on topics ranging from back-end reliability to gate dielectric
and transistor reliability to circuit/product reliability to assembly/
packaging reliability.
- Reliability Year-In-Review Seminar. This seminar provides a summary
of important work published from the previous year in key reliability
areas. Industry experts serve as the “tour guide” and save you time by
collecting and summarizing this information to bring you up to date in a
particular area as efficiently as possible.
- Evening Session Workshops enhance the synergy of the symposium by
affording the attendees an opportunity to meet in informal groups to
discuss key reliability physics topics with the guidance of experienced
moderators. Some of the workshop topics are directly coupled to the
tutorial program to allow more discussion on a particular topic.
- Equipment Demonstrations held in parallel with tutorials and
technical sessions are a unique aspect of this symposium. Manufacturers of
state-of-the-art analytical and test and stress equipment are on hand to
demonstrate their products and systems to individuals and small groups.
Attendees are encouraged to bring samples or questions for onsite analysis
and discussion.
- An Evening Poster Session has become an important part of the IRPS
for authors and attendees to discuss recent research and results in a very
interactive environment.
There
are lots of opportunities to be involved in increasing your understanding of
this technically important field. We look forward to seeing you in Phoenix!