subj: IRPS Deadlines Approaching

Dear Guest,

The 44th annual IEEE International Reliability Physics Symposium (IRPS) is being held March 26-30, 2006, at the McEnery Convention Center in San Jose, California. The IRPS early registration deadline is approaching. To receive reduced registration fees for both the Technical Program and the Tutorials/Year-in-Review Programs, please register on-or-before March 10, 2007.

Now available and "Free for the Taking" are past IRPS Proceedings and Tutorials for years prior to 2003. Visit www.irps.org.

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IRPS 2006 Year-in-Review and Tutorial Programs

The International Reliability Physics Symposium continues a tradition of providing attendees with a Tutorial Program of wide breadth presented by some of the foremost experts in the field. The 2-day Tutorial Program features a set of bound notes from all tutorials as well as a companion CD. Attendees have the opportunity to learn a new area in some technical depth or brush up on the fundamentals with introductory tutorials.

This year's program consists of 24 tutorials being offered on topics ranging from electromigration to gate dielectric reliability to assembly/packaging reliability. For more information on the Tutorial Program, go to www.irps.org and click on "Tutorials."

This year the IRPS Reliability Year-in-Review Program is being held prior to the technical program. This seminar provides a summary of important work published from the previous year in key reliability areas. Industry experts serve as the "tour guide" and save you time by collecting and summarizing this information, to bring you up to date in a particular area as efficiently as possible.

This year's program consists of four broad topics and associated "tour guides":

BEOL Issues, Ennis Ogowa (TI)
Devices, Ed Nowak (IBM)
Soft Error Rate, Philipe Roche (STMicro)
Product Reliability, Walter Riordan (Intel)

Following the speakers, there will be a panel discussion open to all. For more information on the Reliability Year-in-Review Program, go to www.irps.org and click on Reliability Year-in-Review.

Fore more information, or to request technical paper abstracts for the 2006 IRPS, access www.irps.org or contact:

Ron Lacoe, IRPS 2006 Publicity Chair, (310) 336-0118 or ronald.c.lacoe@aero.org

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