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IRPS has been the premiere conference for engineers and scientists to present
new and original work in the area of microelectronic device reliability for over
40 years. Drawing participants from the United States, Europe, Asia and all
other parts of the world, IRPS promotes the reliability and performance of
integrated circuits and microelectronic assemblies through an improved
understanding of failure mechanisms in the user’s environment, while
demonstrating the latest state-of-the-art developments in electronic
reliability.
The focus of the symposium is the 3-day plenary/parallel sessions featuring
original work that identifies new microelectronic failure or degradation
mechanisms, improves understanding of known failure mechanisms, demonstrates new
or innovative analytical techniques, or demonstrates ways to build-in
reliability. Specific areas to be addressed during the 2009 IRPS are reliability
concerns associated with silicon (integrated circuits, discrete devices, MEMS),
non-silicon (GaAs, LEDs and diode lasers, optical fiber and flat panel
displays), and emerging technologies including organic electronics and
nanotechnology:
Other opportunities at the symposium include:
- A 2-day Tutorial Program. Attendees have the opportunity to learn a new area
in some technical depth from an industry expert or brush up on the fundamentals
with introductory tutorials. There are typically about 20 tutorials that are
offered on topics ranging from back-end reliability to gate dielectric and
transistor reliability to circuit/product reliability to assembly/ packaging
reliability.
- Reliability Year-In-Review Seminars. These seminars provide a summary of
important work published from the previous year in key reliability areas.
Industry experts serve as the “tour guide” and save you time by collecting and
summarizing this information to bring you up to date in a particular area as
efficiently as possible.
- Evening Session Workshops enhance the synergy of the symposium by affording
the attendees an opportunity to meet in informal groups to discuss key
reliability physics topics with the guidance of experienced moderators. Some of
the workshop topics are directly coupled to the tutorial program to allow more
discussion on a particular topic.
- Equipment Demonstrations held in parallel with tutorials and technical
sessions are a unique aspect of this symposium. Manufacturers of
state-of-the-art analytical and test and stress equipment are on hand to
demonstrate their products and systems to individuals and small groups.
Attendees are encouraged to bring samples or questions for onsite analysis and
discussion.
- An Evening Poster Session has become an important part of the IRPS for authors
and attendees to discuss recent research and results in a very interactive
environment.
There are lots of opportunities to be involved in increasing your understanding
of this technically important field. We look forward to seeing you in Montreal!
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IEEE Electron Device Society and the 
IEEE Reliability Society