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Become a Corporate Patron of IRPS! Let the world know that your company is a leader in semiconductor device and systems reliability. INFORMATION FOR CORPORATE PATRONS

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2010 Paper Awards

Best Paper	T. Grasser, H. Reisinger, P. J. Wagner, F. Schanovsky, W. Goes, and B. Kaczer, "The Time Dependent Defect Spectroscopy (TDDS) for the Characterization of the Bias Temperature Instability"
Best Poster	Nathan Jack and Elyse Rosenbaum, "ESD Protection for High-Speed Receiver Circuits"
Best Student Paper	J. T. Ryan, P. M. Lenahan, T. Grasser, and H. Enichlmair, "Recovery-Free Electron Spin Resonance Observations of NBTI Degradation"

prior years awards