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Let the world know that your company is a leader in semiconductor device and systems reliability. INFORMATION FOR CORPORATE PATRONS
2012 Paper Awards
| Best Paper |
B. Kaczer, J. Franco, M. Toledano-Luque, Ph.J. Roussel, M.F. Bukhori, A. Asenov, B. Schwarz, M. Bina, T. Grasser, G. Groeseneken, (IMEC, T.U. Wien, U.K. Malasia, University of Glasgow), "The Relevance of Deeply-Scaled FET Threshold Voltage Shifts for Operation Lifetimes" |
| Outstanding Paper |
V. Huard, , E. Pion, F. Cacho, D. Croain, V. Robert, R. Delarte, P. Mergault, N. Ruiz Amador, S. Engels, P. Flatresse, L. Anghel, (STMicroelectronics, TIMA Laboratory), "A Predictive Bottom-Up Hierarchical Approach to Digital System Reliability" |
| Best Student Paper |
C. Miccoli, C. M. Compagnoni, L. Chiavarone, S. Beltrami, A. L. Lacaita, A. S. Spinelli, A. Visconti, (Politecnico di Milano, Micron), "Assessment of Distributed-Cycling Schemes on 45nm NOR Flash Memory Arrays" |
| Best Poster-1 |
J. Fang, S. Sapatnekar, (University of Minnesota), "Understanding the Impactof Transistor-level BTI Variability" |
| Best Poster Paper-2 |
L. Cao, K.J. Ganesh, L. Zhang, P. Ferreira, P. Ho, (University of Texas at Austin), "Grain Structure Analysis and Implications on Electromigration Reliability for Cu Interconnects" |
prior years awards