2016 IEEE International Reliability
2016 Call for Papers
For a listing of the IRPS Program Committee and topics, click here
For 54 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.
Corporate Patrons for 2016:
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