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![]() April 26-30, 2009 For nearly 50 years, IRPS has been the premiere conference for engineers and scientists to
present new and original work in the area of microelectronics reliability. Drawing participants from
the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the
reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an
improved understanding of both the physics of failure as well as the application environment. |
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