Best Paper

2025 IRPS Best Paper

Best Paper

New Burnout Failure at the Chip Edge: Analysis and Preventive Design by a Novel Experimental Approach

Seungmin Lee, Taegon Lee, Gaeun Kim, Kwang-Ryul Lee, Eunji An, Sekwon Hong, Sungjun Kim, Soonkwan Kang, Seokwoo Hong, Hwan Cha, Minkyu Kang, Jaesun Yun, Moongeun Kim, Woongseop Lee, Joonsung Lim, Joonyoung Oh, Kyungyoon Noh, Seungwan Hong, and Sung-Hoi Hur

Best Student Paper

Enhanced Memory Performance in Ferroelectric NAND Applications: The Role of Tunnel Dielectric position for Robust 10-year Retention

Prasanna Venkatesan, Andrea Padovani, Lance Fernandes, Priyankka Ravikumar, Chinsung Park, Huy Tran, Zekai Wang, Hari Jayasankar, Amrit Garlapati, Taeyoung Song, Hang Chen, Winston Chern, Zheng Wang, Kijoon Kim, Jongho Woog, Suhwan Lim, Kwangsoo Kim, Wanki Kim, Daewon Ha, Shimeng Yu, Suman Datta, Luca Larcher, Gaurav Thareja, and Asif Khan

Best Poster Presentation

Towards a Computationally Efficient Verilog-A Defect-Centric BTI Compact Model for Circuit Aging Simulations

Dishant Sangani, Dieter Claes, Pieter Weckx, Ben Kaczer, and Georges Gielen

People’s Choice Paper

A systematic study of temperature, polarity, thickness, and ramp rate dependencies of ramp-voltage stress for SiO2 and its comparison with 2D gate dielectrics

Ernest Y. Wu, Richard G. Southwick, and Baozhen Li

People’s Choice Poster Presentation

Distinct Signatures of Self-Heating and Trap Dynamics on the AC Y-parameters of Advanced n-MOSFETs

Lisa Tondelli, Andries J. Scholten, J. van Beurden, R. M. T. Pijper, Ruben Asanovski, T. V. Dinh, and Luca Selmi

2024 IRPS Best Paper

Best Paper

A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation

Rakesh Ranjan, Pavitra R. Perepa, Ki-Don Lee, Ashish K. Jha, Kartika C. Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma, Minhyo Kang and Peter Kim

Best Student Paper

Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis

Yong Hyeon Yi, Chris Kim, Armen Kteyan, Alexander Volkov, Stephane Moreau and Valeriy Sukharev

Best Poster Presentation

Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS

Wei-Chun Wang, Shida Zhang, Sudarshan Sharma, Minah Lee and Saibal Mukhopadhyay

People’s Choice Paper

Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays

J. Laguerre, S. Martin, J. Coignus, C. Carabasse, M. Bocquet, F. Andrieu and L. Grenouillet

People’s Choice Poster Presentation

Microscopic Modeling of MgO Barrier Degradation Due to Interface Oxygen Frenkel Defects in Scaled MTJ Toward High-Density STT-MRAM

Rina Takashima, Takeo Koike, Shogo Itai, Hideyuki Sugiyama, Young Min Lee, Masaru Toko, Soichiro Ono, Daisuke Watanabe, Soichi Oikawa, Katsuhiko Koi, Hiroyuki Kanaya, Kohji Nakamura and Masahiko Nakayama

2023 IRPS Best Paper

Best Paper

Towards a Universal Model of Dielectric Breakdown

Andrea Padovani, Paolo La Torraca, Jack Strand, Alexander Shluger, Valerio Milo and Luca Larcher

Best Student Papers

Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters

Y. Ding, O. Varela Pedreira, M. Lofrano, H. Zahedmanesh, T. Chavez, H. Farr, I. De Wolf and K. Croes

Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs

Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin and Tibor Grasser

Best Poster Presentation

Polarity Dependency of MOL-TDDB in FinFET

Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myung Soo Yeo, Shinyoung Chung and Jon Haefner

2022 IRPS Best Paper

Best paper

Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets

E. Bury, A. Chasin, B. Kaczer, M. Vandemaele, S. Tyaginov, J. Franco, R. Ritzenthaler, H. Mertens, P. Weckx, N. Horiguchi, D. Linten

Best Student paper

The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena

Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi

Best Poster Presentation

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance

L. Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, O. Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, M. Otto, A. Zaka, J. Hoentschel