Year in Review


2022 IRPS Year in Review

The IRPS Reliability Year in Review session consists of three presentations reviewing the past year's reliability work by experts in the field for areas of high interest. It is a nice augmentation to the tutorials sessions immediately preceding and attendees may obtain keen reliability insights in short amount of time.

3D IC Packaging

Kangwook (Kriss) Lee, SK hynix


Emerging Memory Reliability (MRAM, RRAM, PCM, Ferroelectrics)

Shimeng Yu, Georgia Tech


Reliability and aging aware designs / Circuit reliability

Evelyn Landman, proteanTecs