Program at a Glance — IRPS

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Conference Program

Keynote Speakers

Invited Speakers

Highlighted Papers

Call for Papers

Call For Papers/Topics of Interest

Author Timeline

Preparing Final Manuscripts

Preparing Presentation

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Hotel Information

Patrons/Exhibitors

IRPS Social Media

Future Conf & Archive

IEEE, EDS & RS Information

Board of Directors

Management Committee

Technical Committees

Conferences, Events & Experiences (CEE) Team

Conference Program

Keynote Speakers

Invited Speakers

Highlighted Papers

Call for Papers

Call For Papers/Topics of Interest

Author Timeline

Preparing Final Manuscripts

Preparing Presentation

Registration Fees

Hotel Information

Patrons/Exhibitors

IRPS Social Media

Future Conf & Archive

IEEE, EDS & RS Information

Board of Directors

Management Committee

Technical Committees

Conferences, Events & Experiences (CEE) Team

Folder: Program

Conference Program

Keynote Speakers

Invited Speakers

Highlighted Papers

Folder: Call for Papers

Call For Papers/Topics of Interest

Folder: Speaker Info

Author Timeline

Preparing Final Manuscripts

Preparing Presentation

Folder: Registration

Registration Fees

Hotel Information

Folder: Patrons/Exhibitors

IRPS Social Media

Future Conf & Archive

IEEE, EDS & RS Information

Board of Directors

Management Committee

Technical Committees

Conferences, Events & Experiences (CEE) Team

2024 Conference Program

Will be in January, 2024

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IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

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IRPS
IEEE Meetings, Conferences & Events (MCE)
445 Hoes Lane
Piscataway, NJ 08854

Conference Manager: Lisa Boyd, CMP, CEM, CASE
TEL: +1 732 562 6359
EMAIL: IRPSplanners@ieee.org