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IRPS
IRPS
Home
Program
Conference Program
Keynote Speakers
Year in Review
Tutorials
Workshops
Invited Speakers
Highlighted Papers
Call for Papers
Call For Papers/Topics of Interest
Speaker Info
Author Timeline
Preparing Final Manuscripts
Preparing Presentation
Registration
Registration Fees
Hotel Information
Patrons/Exhibitors
Patrons
Exhibitors
Press
IRPS Social Media
About
IRPS History
Future Conf & Archive
Best Paper
IEEE, EDS & RS Information
Board of Directors
Management Committee
Technical Committees
Conferences, Events & Experiences (CEE) Team
Contacts
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Folder: Program
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Conference Program
Keynote Speakers
Year in Review
Tutorials
Workshops
Invited Speakers
Highlighted Papers
Folder: Call for Papers
Back
Call For Papers/Topics of Interest
Folder: Speaker Info
Back
Author Timeline
Preparing Final Manuscripts
Preparing Presentation
Folder: Registration
Back
Registration Fees
Hotel Information
Folder: Patrons/Exhibitors
Back
Patrons
Exhibitors
Folder: Press
Back
IRPS Social Media
Folder: About
Back
IRPS History
Future Conf & Archive
Best Paper
IEEE, EDS & RS Information
Board of Directors
Management Committee
Technical Committees
Conferences, Events & Experiences (CEE) Team
Contacts

2023 Conference Program

Inside Program: Conference Program l Keynote Speakers l Tutorials
Workshops l Year in Review l Highlighted Paper l Invited paper

Full Program
Guide Book
Download Presentation Descriptions

Technical Program at a glance (28-30th Mar)

  • IRPS2023 Highlighted papers

  • IRPS2023 Invited papers
 

Tutorial program (26-27th Mar)

Home l Program l Call for Papers l Speaker Info l Registration l Patrons/Exhibitors l Press l About l Contacts
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IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

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IRPS
IEEE Meetings, Conferences & Events (MCE)
445 Hoes Lane
Piscataway, NJ 08854

Conference Manager: Lisa Boyd, CMP, CEM, CASE
TEL: +1 732 562 6359
EMAIL: IRPSplanners@ieee.org