IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

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IRPS
IEEE Meetings, Conferences & Events (MCE)
445 Hoes Lane
Piscataway, NJ 08854

Conference Manager: Lisa Boyd, CMP, CEM, CASE
TEL: +1 732 562 6359
EMAIL: IRPSplanners@ieee.org